000 00391nam a2200157 i 4500
001 bg
245 0 _aNondestructive Evalution of Semiconduktor Materials and devies.
260 _aNew York :
_bPlenum Press,
_c1979.
020 _a0306402939
040 _cBPK
041 _apol
080 _a621.382
920 _a0-30640293-9
942 _cKS
008 s pl f |000 0 pol
999 _c19850
_d19850
856 _uhttp://koha.tu.koszalin.pl/cgi-bin/koha/opac-detail.pl?biblionumber=19850
_yKatalog online BPK