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  <titleInfo>
    <title>Metrologia w systemach jakości - 3</title>
    <subTitle>VI Sympozjum Klubu Polskie Forum ISO 9000, Kielce 16-18 października 2000 r</subTitle>
    <partNumber>T.1</partNumber>
  </titleInfo>
  <name type="personal">
    <namePart>Adamczak, Stanisław</namePart>
    <namePart type="date">(1948- )</namePart>
    <role>
      <roleTerm type="text">Red.</roleTerm>
    </role>
  </name>
  <name type="corporate">
    <namePart>Politechnika Świętokrzyska (Kielce)</namePart>
  </name>
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    <place>
      <placeTerm type="text">Kielce</placeTerm>
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    <publisher>Wydaw. Politechniki Świętokrzyskiej</publisher>
    <dateIssued>2000</dateIssued>
    <issuance>monographic</issuance>
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  <language>
    <languageTerm authority="iso639-2b" type="code">pol</languageTerm>
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  <language>
    <languageTerm authority="iso639-2b" type="code">pl</languageTerm>
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    <languageTerm authority="iso639-2b" type="code">en</languageTerm>
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  <physicalDescription>
    <form authority="marcform">print</form>
    <extent>228 s. : fot., rys., wykr. ; 30 cm.</extent>
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  <targetAudience authority="marctarget">specialized</targetAudience>
  <note type="statement of responsibility">[red. Stanisław Adamczak ; Politechnika Świętokrzyska].</note>
  <note>U góry s.tyt.: 35 lat Politechniki Świętokrzyskiej w Kielcach.</note>
  <note>Streszcz. ang. po ref.</note>
  <note>Bibliogr. po ref.</note>
  <subject>
    <topic>Pomiary</topic>
    <topic>metody</topic>
  </subject>
  <subject>
    <topic>Przyrządy pomiarowe</topic>
  </subject>
  <subject>
    <topic>Jakość wyrobów</topic>
    <topic>kontrola</topic>
  </subject>
  <subject>
    <topic>Materiały konferencyjne</topic>
  </subject>
  <classification authority="udc">006.91:621.317:681.12:658.56](061)</classification>
  <identifier type="isbn">8391120066</identifier>
  <identifier type="uri">http://koha.tu.koszalin.pl/cgi-bin/koha/opac-detail.pl?biblionumber=39323</identifier>
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