TY  - BOOK
TI  - Nondestructive Evalution of Semiconduktor Materials and devies
SN  - 0306402939
PY  - 1979///
CY  - New York
PB  - Plenum Press
UR  - http://koha.tu.koszalin.pl/cgi-bin/koha/opac-detail.pl?biblionumber=19850
ER  -